您要查找的是不是:
- GaN epilayer by infrared spectroscopic ellipsometry[J]. 引用该论文 王静;李向阳;刘骥;黄志明.
- The measuring condition for principle angle in spectroscopic ellipsometry is analyzed. 对椭圆偏振光谱中的主角测量条件进行了分析。
- A simple method using spectroscopic ellipsometry to measure uniaxial liquid crystal layer is introduced. 探讨了利用普通光谱型椭偏仪对各向异性液晶层进行综合性测量的可行性。
- Analysis of Measuring Condition for Principle Angle in Spectroscopic Ellipsometry[J]. 引用该论文 赵海斌;夏国强;陈岳立;李晶;周仕明;陈良尧.
- The prepared ZnO/ZnMgO/SiO2 has been characterized by means of AFM,XRD,photoluminescence(PL) as well as spectroscopic ellipsometry(SE). 对所制备的ZnO/ZnMgO/SiO2进行了原子力显微镜(AFM)、X射线衍射(XRD)、光致发光(PL)、椭圆偏振光谱(SE)表征。
- About one century history of novel spectroscopic ellipsometry(SE) is reviewed.Its classification,applications and new developments are introduced and described in detail. 本文回顾了独具特色的椭偏光谱学近一个世纪的历史发展,综述了椭偏光谱学的应用现状,指出了其前沿研究领域,并对这一古老而又年轻的光谱学分支作了展望。
- Variable angle spectroscopic ellipsometry (VASE) is important for metrology in several industries, and is a powerful technique for research on new materials and processes. 在很多种工业上,可变角度椭偏仪对于形态学是很重要的,而且对于研究新材料和新制程更是一个强而有力的技术。
- The optical properties and components of the films were characterized by spectroscopic ellipsometry, X-ray photoelectron spectroscopy and Perkin-Elmer Lambda900 spectrophotometer, etc. . 通过椭圆偏振仪、X-ray光电子能谱、分光计等设备,对制备薄膜的光学性能、成分进行了表征。
- Spectroscopic ellipsometry indicates that the quantum effect of ZnO quantum dot leads to the fact that the absorption energy of exciton(3.76 eV) is bigger than the band gap of bulk ZnO. SE表征发现ZnO量子点的量子效应导致了ZnO量子点的激子吸收能(3.;76eV)比ZnO体晶的能带隙(3
- Variable angle spectroscopic ellipsometry(VASE)is a instrument for measuring optical film refractive index and thickness and is a powerful technique for research on new materials and processes. 可变角度的光谱椭偏仪(VASE)是一种测量光学薄膜折射率和厚度的仪器,它对于新材料和新过程的研究是一种强有力的技术手段。
- Spectroscopic ellipsometry has been widely used as a non-destructive and a non-touched optical tool for characterizing the optical properties and layered structure of bulk and thin film materials. 现代椭圆偏振光谱测量作为一种非接触、非破坏性测量的方法广泛应用于工业生产和科学研究,它是研究光频电磁波在两媒质间界面或薄膜中传播时发生的现象及其特性的一种光学方法。
- Spectroscopic ellipsometry(SE) is introduced and described systematically on basic principle and developments.A new optimum method - simulated annealing algorithm is applied in the inversion of SE. 本论文系统介绍了椭圆偏振光谱的基本原理,将模拟退火方法这一新颖的优化过程引入到椭圆偏振光谱的分析中。
- As a non-destructive and a non-contacting tool to characterize the optical properties of the photonics materials, spectroscopic ellipsometry has been widely used in industry and academic research. 椭圆偏振光谱测量是一种非接触、非破坏的测量方法,已经被广泛应用到光电子材料工艺和科学研究中。
- dynamic spectroscopic ellipsometry 动态椭偏术
- Infrared spectroscopic ellipsometry(IRSE) 红外椭偏光谱
- infrared spectroscopic ellipsometry 红外椭圆偏振光谱
- Spectroscopic Ellipsometry Characteristics and the Optical 非晶态高聚物的椭圆偏振光谱和光学折射率的测定
- Spectroscopic Ellipsometry Theory of Anisotropic Thin Films 各向异性择优取向薄膜的椭偏光谱术理论
- Keywords carbon film;spectroscopic ellipsometry;chemical bond; 碳薄膜;椭偏光谱;化学键;
- Keywords spectroscopic ellipsometry;Nickel;Cobalt;Ion implantation; 光谱椭圆法;镍;钴;离子注入;