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- Abstract Secondary Ion Mass Spectrometry (SIMS) is a new analytical techniquefor labile, nonvolatile organic compounds. 摘要 二次离子质谱法(SIMS)是一种分析易热解和不挥发的有机化合物的新技术。
- Abstract Secondary ion mass spectrometry(SIMS) is more sensitive than other surface microregion analysis instrumentals. 摘要 二次离子质谱 ( SIMS)比其他表面微区分析方法更灵敏。
- Time-of-Flight secondary ion mass spectrometry (TOF-SIMS) is a very sensitive surface analytical technique, well established for many industrial and research applications. 飞行时间二次离子质谱(TOF-SIMS)是一种非常灵敏的表面检测技术。
- The experiments were performed by means of Secondary Ion Mass Spectroscopy (SIMS) and Auger Electron Spectroscopy (AES). 采用了二次离子质谱仪(SIMS)和俄歇电子谱仪(AES)进行表面分析。
- The Secondary Ion Mass Spectrometer (SIMS). especially dynamic SIMS. is the most suitable instrument for particle isotopic analysis. 动态型二次离子质谱(SIMS)是进行微粒同位素分析最适用的测量仪器之一。
- Isotope ratios of Pb contained in wares were measured using Time-Of-Flight Secondary Ion Mass Spectrometry(TOF-SIMS)without any references. 介绍了用飞行时间二次离子质谱法对器物中的铅同位素比值的测量。
- In this paper the formation of molecule-ion clusters in the liquid secondary ion mass spectrometric analysis of phospholipids DMPG, DMPC and DMPE has been studied systematically. 对3种极性头不同的磷脂DMPG、DMPC、DMPE的液相二次离子质谱分析中出现的分子离子簇现象进行了系统的研究。
- A time-of-flight secondary ion mass spectrometer(TOF-SIMS),X-ray photoelectron spectroscopy(XPS),an atomic force microscopy(AFM),and contact angle measurements were used to characterize the monolayer. 使用时间飞行二次离子质谱仪(TOF-S IM S)、X射线光电子能谱仪(XPS)、原子力显微镜(AFM)和接触角测量仪对FTE自组装膜进行了表征。
- The enhanced adhesion of Cu films on Si substrates under MeV Cl ion beam irradiation was studied through analysis of Scanning Auger Microprobe (SAM) and Secondary Ion Mass Spectroscopy(SIMS). 本文通过用扫描俄歇微探针（SAM）和二次离子质谱（SIMS）分析了高能氯离子注 入Cu/Si系统，对Cu薄膜附着力增强效应进行了研究。
- To study diffusion behaviors, secondary ion mass spectrometer (SIMS) along with the Boltzmann-Matano inverse method is used to derive concentration-dependent diffusivity of H+ in Z-cut LiNbO3. 在扩散模型方面，以二次离子质谱仪纵深分析，搭配数值方法反推出氢离子于铌酸锂晶体中的浓度相依扩散率。
- secondary ion mass spectrometry, SIMS 次级离子质谱
- The instrument directs the secondary ions to a mass spectrometer that identifies their compositions. 仪器会将次级离子导向质谱仪，以?定其组成。
- secondary ion mass spectrometer (SIMS) 二次离子质谱仪
- Latest Progress in Secondary Ion Mass Spectroscopy 二次离子质谱学的新进展
- secondary ion emission microanalyzer 二次离子发射显微分析仪
- secondary ion mass spectroanalyzer 二次离子质谱分析器
- secondary ion mass spectrometry (SIMS) 次级离子质谱
- secondary ion mass chemical analysis 二次离子质量化学分析
- secondary ion mass microanalysis 次级离子质量微量分析
- secondary ion mass spectroscopy(SIMS) [化] 次级离子质谱法
