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- Abstract Secondary Ion Mass Spectrometry (SIMS) is a new analytical techniquefor labile, nonvolatile organic compounds. 摘要 二次離子質譜法(SIMS)是一種分析易熱解和不揮發的有機化合物的新技術。
- In addition,the reactant ion yield can be effectively increased by choosing a proper temperature in drift tube,and improves the sensitivit... 選擇合適漂移管工作溫度,能有效地增加反應物離子的產量,從而提高系統檢測的靈敏度和選擇性。
- Abstract Secondary ion mass spectrometry(SIMS) is more sensitive than other surface microregion analysis instrumentals. 摘要 二次離子質譜 ( SIMS)比其他表面微區分析方法更靈敏。
- In addition, the reactant ion yield can be effectively increased by choosing a proper temperature in drift tube, and improves the sensitivity and selectivity of system. 選擇合適漂移管工作溫度,能有效地增加反應物離子的產量,從而提高系統檢測的靈敏度和選擇性。
- Time-of-Flight secondary ion mass spectrometry (TOF-SIMS) is a very sensitive surface analytical technique, well established for many industrial and research applications. 飛行時間二次離子質譜(TOF-SIMS)是一種非常靈敏的表面檢測技術。
- The experiments were performed by means of Secondary Ion Mass Spectroscopy (SIMS) and Auger Electron Spectroscopy (AES). 採用了二次離子質譜儀(SIMS)和俄歇電子譜儀(AES)進行表面分析。
- The Secondary Ion Mass Spectrometer (SIMS). especially dynamic SIMS. is the most suitable instrument for particle isotopic analysis. 動態型二次離子質譜(SIMS)是進行微粒同位素分析最適用的測量儀器之一。
- Isotope ratios of Pb contained in wares were measured using Time-Of-Flight Secondary Ion Mass Spectrometry(TOF-SIMS)without any references. 介紹了用飛行時間二次離子質譜法對器物中的鉛同位素比值的測量。
- In this paper the formation of molecule-ion clusters in the liquid secondary ion mass spectrometric analysis of phospholipids DMPG, DMPC and DMPE has been studied systematically. 對3種極性頭不同的磷脂DMPG、DMPC、DMPE的液相二次離子質譜分析中出現的分子離子簇現象進行了系統的研究。
- A time-of-flight secondary ion mass spectrometer(TOF-SIMS),X-ray photoelectron spectroscopy(XPS),an atomic force microscopy(AFM),and contact angle measurements were used to characterize the monolayer. 使用時間飛行二次離子質譜儀(TOF-S IM S)、X射線光電子能譜儀(XPS)、原子力顯微鏡(AFM)和接觸角測量儀對FTE自組裝膜進行了表徵。
- The enhanced adhesion of Cu films on Si substrates under MeV Cl ion beam irradiation was studied through analysis of Scanning Auger Microprobe (SAM) and Secondary Ion Mass Spectroscopy(SIMS). 本文通過用掃描俄歇微探針(SAM)和二次離子質譜(SIMS)分析了高能氯離子注 入Cu/Si系統,對Cu薄膜附著力增強效應進行了研究。
- To study diffusion behaviors, secondary ion mass spectrometer (SIMS) along with the Boltzmann-Matano inverse method is used to derive concentration-dependent diffusivity of H+ in Z-cut LiNbO3. 在擴散模型方面,以二次離子質譜儀縱深分析,搭配數值方法反推出氫離子於鈮酸鋰晶體中的濃度相依擴散率。
- The instrument directs the secondary ions to a mass spectrometer that identifies their compositions. 儀器會將次級離子導向質譜儀,以?定其組成。
- secondary ion mass spectrometry, SIMS 次級離子質譜
- secondary ion mass spectrometer (SIMS) 二次離子質譜儀
- Effect of laser facula area on ion yield in multiphoton ionization process 激光光斑面積對多光子電離離子產量的影響
- Latest Progress in Secondary Ion Mass Spectroscopy 二次離子質譜學的新進展
- secondary ion emission microanalyzer 二次離子發射顯微分析儀
- secondary ion mass spectroanalyzer 二次離子質譜分析器
- Conclusions Estrogen could not only inhibit hydrogen ions yielding, but also change ACP and TRAP activities, therefore inhibit the bone resorption by osteoclastes. 結論雌激素能夠抑制氫離子釋放,同時能改變ACP和TRAP活性,因而能直接抑制破骨細胞的骨吸收功能。