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- The Secondary Ion Mass Spectrometer (SIMS). especially dynamic SIMS. is the most suitable instrument for particle isotopic analysis. 动态型二次离子质谱(SIMS)是进行微粒同位素分析最适用的测量仪器之一。
- A time-of-flight secondary ion mass spectrometer(TOF-SIMS),X-ray photoelectron spectroscopy(XPS),an atomic force microscopy(AFM),and contact angle measurements were used to characterize the monolayer. 使用时间飞行二次离子质谱仪(TOF-S IM S)、X射线光电子能谱仪(XPS)、原子力显微镜(AFM)和接触角测量仪对FTE自组装膜进行了表征。
- To study diffusion behaviors, secondary ion mass spectrometer (SIMS) along with the Boltzmann-Matano inverse method is used to derive concentration-dependent diffusivity of H+ in Z-cut LiNbO3. 在扩散模型方面，以二次离子质谱仪纵深分析，搭配数值方法反推出氢离子于铌酸锂晶体中的浓度相依扩散率。
- secondary ion mass spectrometer (SIMS) 二次离子质谱仪
- time-of-flight ion mass spectrometer 飞行时间离子质谱计
- Abstract Secondary Ion Mass Spectrometry (SIMS) is a new analytical techniquefor labile, nonvolatile organic compounds. 摘要 二次离子质谱法(SIMS)是一种分析易热解和不挥发的有机化合物的新技术。
- Abstract Secondary ion mass spectrometry(SIMS) is more sensitive than other surface microregion analysis instrumentals. 摘要 二次离子质谱 ( SIMS)比其他表面微区分析方法更灵敏。
- Time-of-Flight secondary ion mass spectrometry (TOF-SIMS) is a very sensitive surface analytical technique, well established for many industrial and research applications. 飞行时间二次离子质谱(TOF-SIMS)是一种非常灵敏的表面检测技术。
- Isotope ratios of Pb contained in wares were measured using Time-Of-Flight Secondary Ion Mass Spectrometry(TOF-SIMS)without any references. 介绍了用飞行时间二次离子质谱法对器物中的铅同位素比值的测量。
- In this paper the formation of molecule-ion clusters in the liquid secondary ion mass spectrometric analysis of phospholipids DMPG, DMPC and DMPE has been studied systematically. 对3种极性头不同的磷脂DMPG、DMPC、DMPE的液相二次离子质谱分析中出现的分子离子簇现象进行了系统的研究。
- Particle Analysis in Nuclear Safeguards and Secondary Ion Mass Spectrometer 核保障的微粒分析与二次离子质谱仪
- secondary ion mass spectrometry, SIMS 次级离子质谱
- secondary ion mass spectrometry (SIMS) 次级离子质谱
- second ion mass spectrometry (SIMS) 二次离子质谱仪
- selected ion mass spectrometry (SIM) 选择离子质谱
- This paper describes a new multi ion and electron beam system for preparing optic thin films. 本文介绍一种新型的光学薄膜制备用多离子束电子束系统。
- Keywords Shengli Oil-Gas Province;organic inclusions;the system of oil and gas pool;fluorescence microscopy;Mico-FT;IR;time of Flying Secondary ion Mass Spectrometer （TOF-SIMS）; 胜利油气区;有机包裹体;油气成藏系统;荧光光谱;显微傅立叶红外光谱;飞行时间二次离子质谱;
- Fast Atom Bombardment and Secondary Ion Mass Spectrometry 快原子轰击电离和二次离子质谱
- Mass spectrometer plays a key role of modern analytical technology. 质谱是现代分析技术皇冠上的明珠。
- Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) 飞行时间二次离子质谱
