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- The application of X-ray energy dispersive spectroscopy(EDS) is widespread in materials research. 射线能量色散谱(EDS)分析方法在材料领域得到了广泛的应用。
- Cu(In,Ga)Se_2 thin films were characterized by energy dispersive spectroscopy (EDS),scanning electron microscopy (SEM) and X-ray diffraction (XRD). Cu(In,Ga)Se2薄膜的性能研究分别采用扫描电镜自带能谱仪(EDS)、X射线衍射(XRD)和扫描电镜分析Cu(In,Ga)Se2薄膜的化学组成、晶体结构和表面形貌。
- The apparent defect of some stainless steel products was analyzed by scanning electron microscope ( SEM ), X-ray Energy Dispersive Spectroscopy ( EDS ) and X-ray Wavelength Dispersive Spectroscopy ( WDS ). 利用扫描电子显微镜(SEM)及其附带的X射线能谱仪(EDS)、X射线波谱仪(WDS)对某些不锈钢制品的表观缺陷进行了较深入的分析。
- The cenosphere particles are characterized through X-ray diffraction analysis (XRD), scanning electron microscope (SEM), energy dispersive spectroscopy (EDX) and X-ray photoelectron spectroscopy (XPS) during and after the coating process. 采用硝酸银代替氯化钯为活化剂;在空心微珠表面化学镀Ni-P合金镀层;用X-射线衍射仪(XRD)、能谱仪(EDX)、扫描电镜(SEM)和X射线光电子能谱仪(XPS)对其进行分析表征.
- Surface morphology and composition of the A1 film were characterized with field emission scanning electron microscopy (FESEM) and energy dispersive spectroscopy (EDS) to optimize A1 film growth conditions. 利用场发射扫描电镜(FESEM)及能量散射谱(EDS)分析仪对沉积的铝层进行了表面形貌的表征和化学组分的分析。
- The selenized films were characterized by energy dispersive spectroscopy (EDS), X-ray diffraction (XRD) and scanning electron microscopy (SEM) etc. At first Mo thin films substrate were prepared by magnetron sputtering on the SLG. 通过X射线衍射仪(XRD)、扫描电镜(SEM)、扫描电镜自带能谱仪(EDS)以及Van der Pauw方法对制备的薄膜的各种性能进行表征。
- The structure, morphology, composition and optical properties of CIS thin films were characterized by energy dispersive spectroscopy (EDS), X-ray diffraction (XRD), Introduced coupled plasma (ICP), scanning electron microscopy (SEM) and UV-VIS etc. 通过X射线衍射仪(XRD)、扫描电镜(SEM)、能谱仪(EDS)和等离子体耦合谱(ICP)、紫外可见分光光度计(UV-VIS)等方法对CIS薄膜进行了详细的表征。
- Microstructural changes of a fusion cast Al2O3-ZrO2-SiO2 (AZS) block taken from the side wall of a glass tank furnace were studied by scanning electron microscopy, energy dispersive spectroscopy and X-ray diffraction. 借助扫描电镜、能谱仪和X射线衍射研究了玻璃熔窑池壁用熔铸Al2O3?ZrO2?SiO2(AZS)大砖蚀变后残砖的显微结构变化。 在玻璃液?
- The interface of the diamond film and the active filler metal was observed by scanning electron microscope - energy dispersive spectroscopy and X-ray to dislcose the bonding medanism mechanism. 用扫描电镜、电子探针及X射线衍射区研究了金刚石膜与活性钎料界面,揭示了钎焊界面的形成机理。
- By using scanning electron microscopy (SEM) and X-ray energy dispersive spectroscopy (EDS), the compatibility of polypropylene (PP)/ poly (vinyl chloride) (PVC) and multi-monomer grafted polypropylene PP-g-(St-co-MMA)]/PP/PVC blends were investigated. 利用扫描电子显微镜(SEM)和X射线能谱仪(EDS)对聚丙烯/聚氯乙烯(PP80/PVC20)二元体系,以及聚丙烯多单体接枝物[PPg(StcoMMA)]/PP/PVC三元体系的相容性进行了研究。
- The apparent defect of some stainless steel products was analyzed by scanning electron microscope (SEM), X-ray Energy Dispersive Spectroscopy (EDS) and X-ray Wavelength Dispersive Spectroscopy (WDS). 摘要利用扫描电子显微镜(SEM)及其附带的X射线能谱仪(EDS)、X射线波谱仪(WDS)对某些不锈钢制品的表观缺陷进行了较深入的分析。
- energy dispersive spectroscopy (EDS) analysis EDS分析
- X-ray energy dispersive spectroscopy (EDS) X射线能量色散谱（EDS）
- X-ray energy dispersive spectroscopy X射线能谱分析
- A fractured turbine blade was characterized by means of optical microscope, scanning electron microscope (SEM) and energy dispersion spectroscopy (EDS). 摘要对汽轮机断裂叶片进行了现场调研、断口扫描电镜、能谱及金相组织分析。
- Energy dispersive spectroscopy 能谱
- The figure and property of the TiO_2 nanotube covered with Ag and Au were characterized by SEM and energy dispersive X-ray spectroscopy(EDX). 利用扫描电镜(SEM)和X射线能谱仪(EDX)对包覆Ag、Au后的纳米管形貌结构及性能进行了表征.
- The metallized probes are characterized by optical microscopy, scanning electron microscopy (SEM), and energy dispersive X-ray spectroscopy (EDXS). 利用光学显微镜、扫描电子显微镜及X-射线能谱对镀银探针进行了表征。
- The surface defects of silver coins was analysed with augerelectron spectroscopy( AES), Scanning electronic microscope( SEM) and energy dispersive spectrum( EDS). 采用扫描电镜、量色散谱和俄歇电子能谱检测方法，对银币表面缺陷进行了分析。
- The surface defects of silver coins was analysed with auger electron spectroscopy (AES), Scanning electronic microscope (SEM) and energy dispersive spectrum (EDS). 采用扫描电镜、能量色散谱和俄歇电子能谱检测方法,对银币表面缺陷进行了分析。
