The selenized films were characterized by energy dispersive spectroscopy (EDS), X-ray diffraction (XRD) and scanning electron microscopy (SEM) etc. At first Mo thin films substrate were prepared by magnetron sputtering on the SLG.

• 通过X射线衍射仪(XRD)、扫描电镜(SEM)、扫描电镜自带能谱仪(EDS)以及Van der Pauw方法对制备的薄膜的各种性能进行表征。