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- XRD图谱XRD spectrum
- XRD图谱分析XRD
- 随着酸解时间的延长 ,[SiO4 ]单四面体与 [CaO6 ]八面体共棱连接方向成为主要浸蚀方向 ,在XRD图谱中表现为d =0 .2 98nm衍射峰一直保持较大的衍射强度。while the co-edge orientation between (CaO_(6)) octahedron and (SiO_(4)) single tetrahedron becomes main etching orientation along with the extension of time for acid hydrolysis. This can be confirmed by the stronger diffraction peak on d=0.298 nm in XRD pattern.
- Li-AG试验电池在LiAsF6-EC+DEC电解液中充电时,依次形成Li0.5C6和LiC6两种化合物,这可由XRD图谱及碳电极贮存期间电极电位的变化曲线获得证明。Both Li 0.5 C 6 and LiC 6 compounds were successively formed during charge process of AG electrode in Li AG cell using LiAsF 6 EC+DEC electrolyte,this result was proved by XRD patterns and the potential variation of AG electrode with storage time.
- 测试出NbSe2晶体的临界温度为7.2K,30 K附近发生CDW转变,出现了CDW和超导电性共存的现象,通过分析NbSe2晶体的r-T曲线和NbSe2晶体的XRD图谱,讨论了低温下NbSe2晶体的重入现象。The transition point of CDW is near to 30k accompanying with the superconductiviting phenomenon. By analyzing the XRD patterns and the r-T curve of NbSe_2,the reappearance of the SbSe_2 crystals at low temperature are discused.
- 通过对PCD复合片中聚晶金刚石层加热前后的XRD图谱,以及在不同气氛环境下的DTA-TG分析,对聚晶金刚石的石墨化温度以及在加热过程中PCD的氧化和石墨化是否同时发生的问题进行了研究。Based on the analysis on XRD diagram of polycrystalline diamond layer in PCD composite piece and DTA-TG analysis under different atmospheres,a research has been carried out on the graphitization temperature of polycrystalline diamond and whether the oxidation and graphitization of PCD happen simultaneously during heating process or not.
- 正是这些标记物被用于绘制遗传图谱。It is these markers that are used to do genetic mapping.
- XRDX-ray diffraction
- 进化图谱Icons of Evolution - Jonathan Wells
- XRD法XRD method
- 新图谱new atlas
- XRD图XRD spectrum
- 图谱库Database
- XRD谱XRD
- GPC图谱GPC chromatogram
- SEM图谱SEM
- XRD方法X-ray diffraltion methods
- XRD谱图XRD
- 干旱胁迫下小麦叶片的电阻抗图谱参数与生理参数的关系The Relationship between Electrical Impedance Spectroscopy Parameters and Physiological Parameters of Wheat Leaves under Drought Stress
- XRD务析XRD analysis