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- This paper introduces the verification method of ASL3000 IC test system. 摘要介绍了ASL3000集成电路测试系统的检定方法。
- At last, an effective solution to the synchronization of digital and analog mixed signal IC test system is found so that the test system works accurately, stably and reliably. 提出了解决数模混合信号集成电路测试系统同步问题的有效方案，使数模混合信号集成电路测试系统准确、稳定和可靠。
- New Architecture of Accurate Clock Generator in IC Test System IC测试系统精密定时器的新结构
- ATS of D/A Mixed Signal IC Test System Based on VXI Bus VXI数模混合信号集成电路测试系统
- The Development Of Web Test System Based On ASP. 技术的网络考试系统的开发。
- Remove power from the test system. 断开测试系统的电源。
- The API-ZYM test system is a standardized. API-ZYM实验是一种标准的试验手段。
- With development of the semiconductors industry and appearance of new ASIC, SOC devices the paper analyzes new requirement and challenge proposed by IC test, and described new solution of the ATE and new system feature also. 本文从半导体产业的飞速发展 ,新型集成电路ASIC、SOC等器件的出现 ,分析了对IC测试提出的新要求和挑战。 阐述了ATE(自动测试设备 )产业可采取的新的解决方案及新型测试系统的性能与特点。
- IC Test System 集成电路测试系统
- A computer-aided spark voltage test system for working electrolyte. 工作电解液闪火电压的计算机测试系统。
- Analysing the capability of IC test in ATES, Points out requiring to solve theproblems based on Bill Transmitter Order(BTO), and then discusses the operation tactics ofIC test. 分析了ATES测试的生产能力，指出了测试生产中的不足之处，最后阐述了IC测试运作策略。
- Assists to develop and to maintain the structure test system. 协助开发并维护结构测试系统。
- Now we focus on IC test handler, it's production included most of the assembly types, for example DIP，SOP，SSOP，TSSOP，QFP，TO series，QFN etc. 目前主要生产集成电路分选机，产品品种涵盖目前市场上的绝大多数封装品种，如DIP，SOP，SSOP，TSSOP，QFP，TO系列等。
- The ATC cannot install / upgrade the ICDL Test System. 核准考试中心无法安装/更新ICDL考试系统。
- Maintain accelerator test system and facilities for R&D. 维护用于开发的加速器测试系统及设施。
- Testing system goes towards class system. 科举制度向等级制度演变。
- CMOS device dimensions scale down to the very deep submicrometer.ICs are going towards higher density, higher speed and lower power dissipation making new challenges on IC test and design for test. 摘要CMOS器件进入超深亚微米阶段，集成电路(IC)继续向高集成度、高速度、低功耗发展，使得IC在测试和可测试性设计上都面临新的挑战。
- An on-line test system, may provide an inspiration for the beginner, ha-ha! 详细说明:一个在线考试系统,可以为初学者提供一点灵感,呵呵!
- This is the school on-line test system, the content has the modification! 这个是学校的网上考试系统,内容有所改动!
- This algorithm has been used in the dynamic test system of HJD-28 digital SPC. 采用本文介绍的测试算法设计的测试诊断程序已实际用于 HJD-28用户程控交换机的动态测试系统中.
