With development of the semiconductors industry and appearance of new ASIC, SOC devices the paper analyzes new requirement and challenge proposed by IC test, and described new solution of the ATE and new system feature also.

• 本文从半导体产业的飞速发展 ,新型集成电路ASIC、SOC等器件的出现 ,分析了对IC测试提出的新要求和挑战。 阐述了ATE(自动测试设备 )产业可采取的新的解决方案及新型测试系统的性能与特点。