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- IC测试模式IC test model
- 测试measure and test
- 面向纳米IC测试的ATEATE Towards Nano IC Testing
- 自测试模式self-test mode
- IC测试系统精密定时器的新结构New Architecture of Accurate Clock Generator in IC Test System
- 低毒测试模式lower toxic test mode
- 面向IC测试技术的精密运动平台的设计Design of the High-Precision Motion Platform for IC Testing
- 自动测试模式生成ATPG
- 改变测试模式,有快速Change to Through Test Mode
- IC卡IC-card
- 营销模式marketing model
- 进行测试test
- 模式的modal
- 传输模式transfer mode
- 测试结果test result
- 分析了ATES测试的生产能力,指出了测试生产中的不足之处,最后阐述了IC测试运作策略。Analysing the capability of IC test in ATES, Points out requiring to solve theproblems based on Bill Transmitter Order(BTO), and then discusses the operation tactics ofIC test.
- 软件测试software test
- 心理测试psychological test
- 测试报告test report
- 测试方法test method(s)