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- fault test generation 故障测试生成
- A Multiple Faults Test Generation Method for Digital Circuits with Artificial Neural Network 数字电路多故障测试生成的神经网络方法研究
- It is simple and eliminates the complicated timing issue during test generation for the crosstalk fault in the conventional approaches. 此方法简单且消除了传统方法在产生串音障碍测试图样时的复杂时间考量。
- A multiple faults test generation algorithm based on neural networks for digital circuits 基于神经网络的数字电路多故障测试生成算法
- The result indicates that the technology manipulates easily and is effective,the fault coverage reaches 90%,it is a feasible test generation technology. 仿真结果表明，该方法操作简单、有效，故障覆盖率达到了90%25，是一种很可行的存储器板测试生成方法。
- The fault coverages achieved by the test generation procedures based on genetic algorithms are smaller than the deterministic test generation procedures for combinational circuits. 本文分析指出造成这种现象的一个可能原因在于,组合电路测试生成过程中存在高阶、长距离模式,从而导致遗传算法容易陷入局部极值或早熟收敛。
- Abstract: A fast and improved method for BIST is introduced, which is aimed to improve the fault test method for combinational circuit. 摘要: 对组合电路的测试提出了一种将确定性测试生成方法与内建自测试相结合的设计方案。
- On the other hand, incrementing K also increases the probability of overlapping, hindering the test generation process. 就另一方面而言，增加K块区域且增加重叠的可能性，也阻挡了测试生成过程。
- The simulation results show that it is available to use chaotic search for I(subscript DDT) test generation. 模拟实验结果表明，将这种方法用于瞬态电流测试产生是可行的。
- By using backtrace and backtrack of FAN algorithm, the efficiency of test generation algorithm has be improved. 利用了FAN算法的多路回退和回溯等主要特色，提高了测试生成算法的效率。
- Unit test generation does not automatically add the AspNetDevelopmentServer attribute or the TryUrlRedirection method call. 单元测试生成不会自动添加AspNetDevelopmentServer属性或TryUrlRedirection方法调用。
- Low coverage indicates a process problem, which might require test generation technique to be improved, or training to be imparted to the tester. 低的覆盖率表明方法有问题，可能是测试生成技术需要改进，也可能需要给测试人员提供培训。
- Bai, Andre, et.al., 1998: Fast Antirandom (FAR) Test Generation to Improve Code Coverage. Software Research Institute. SanFrancisco, CA, USA. 何淼等，1995：板齿鼠种群中长期预测的时间序列模型。走向21世纪的中国生态学。中国生态学会。
- In this case, the test generation procedure creates a private accessor, which enables the test assembly to access those types, both internal and private. 在这种情况下,测试生成过程将创建一个专用访问器,使测试程序集能够访问这些类型。
- As the complexity of VLSI circuits and their quality requirements are increasing, theproblem of test generation is becoming more important and more difficult. 随着VLSI 电路的复杂度越来越高,对其质量要求也越来越高,因此测试生成问题也就变得更加重要,同时也变得更加困难。
- At this point your logic is at fault. 在这一点上你的推理是错误的。
- A Method for Memory Fault Test in Real-time Systems 应用于实时系统中存储器故障测试的一种新方法
- A simple test will show if this is real gold. 简单的试验就能证明这是否是真金。
- According to the fault of charge indicating lamp always being on or flashing, it systematically analyses its induction output circuit and exciting circuit and affords the fault testing procedures. 针对标致汽车行驶中充电指示灯常亮或微微闪动的故障，从感应输出电路、激磁电路进行系统分析，并提出检查故障的步骤。
- The grumpy man found fault with everything. 那个性情乖戾的人对什么事都要找岔。
