SiN thin films的用法和樣例:
例句
- This paper describes the study on the component and structure of the silicon oxide and silicon nitride films by infra-red absorbed spectrum.
利用紅外吸收譜等微觀分析對氧化硅和氨化硅薄膜的成分和結構進行了研究。 - Depth crystalline evolution property for microcrystalline Si films deposited by ion-beam sputtering was studied.
研究了離子束濺射製備微晶硅薄膜的生長縱向結晶演化過程。