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- Some fundamental aspects of Auger electron spectroscopy have been reviewed. 介绍了俄歇电子谱术的某些基本问题。
- Raman, Auger Electron Spectroscopy (AES) and X ray Photoelectron Spectroscopy (XPS) were used to analyze the samples. 用拉曼谱 (Raman)、俄歇电子能谱 (AES)以及X射线光电子能谱(XPS)等方法对样品进行研究。
- The Ge mole fraction of 15-16% was determined by Auger electron spectroscopy (AES). 俄歇电子谱(AES)测试表明，所制备的Si_(1-x)Ge_x中Ge含量约为15-16%25。
- The change of Si/Au interface at the Au-modified Si photoelectrode before and after potential sweep was studied with Auger Electron Spectroscopy (AES). 本文报道了用离子剥层俄歇能谱研究Au修饰Si光电极电位扫描前后Si/Au界面的变化。
- The experiments were performed by means of Secondary Ion Mass Spectroscopy (SIMS) and Auger Electron Spectroscopy (AES). 采用了二次离子质谱仪(SIMS)和俄歇电子谱仪(AES)进行表面分析。
- The interface diffusion phenomena of BTO/Si were systematically studied by Auger electron spectroscopy(AES) and X-ray photoelectron spectroscopy(XPS). 通过俄歇电子能谱(AES),X光电子能谱(XPS)等分析手段系统研究了在Si基片上直接生长BTO铁电薄膜过程中的界面扩散现象。
- The composition of surface layer of uranium and treated uranium have been analyzed respectively by Auger Electron Spectroscopy (AES). 用俄歇电子谱(AES)分析了铀试样处理前后表层的成分变化。
- Abstract The heated oxidation film of U-Nb alloy is studied by auger electron spectroscopy (AES) at different temperature in the high vacuum chamber. 摘要 用俄歇电子能谱(AES)研究了高真空下,环境温度对铀铌合金真空氧化膜的影响。
- Auger electron spectroscopy (AES), scanning electron microscopy (SEM) and atomic force microscopy (AFM) are used to analyze component and surface morphology of the films. 用俄歇电子能谱(AES)、扫描电镜(SEM)和原子力显微镜(AFM)对薄膜的组成成分和表面形貌进行了分析。
- The initial oxidation of uranium and uranium samples which were overlapped energy ion-implanted with C ions was studied respectively by Auger electron spectroscopy(AES). 用俄歇电子能谱(AES)分别对高真空室中铀样品及多能量叠加离子注入碳铀样品与氧气吸附及初始氧化过程进行了研究。
- The obtained self-assembled monolayers were characterized with water contact angle goniometry, auger electron spectroscopy and X-ray photoelectron spectroscopy. 使用接触角、俄歇电子能谱及X射线光电子能谱等方法进行表征。
- The application of X-ray photoelectron spectroscopy (XPS) and X-ray auger electron spectroscopy (XAES), Scanning and Tunneling Electron Microscopy (SEM-EDX, TEM) in Interface Chemistry. 射线光电子能谱(XPS)和俄歇电子光谱(XAES);扫描和透射电子显微镜(SEM-EDX;TEM)在界面化学方面的应用.
- A comprehensive study has been performed on the phase compositions, element distributions and binding states of the N + B ion implanted layer by means of X- ray diffraction(XRD), Auger electron spectroscopy(AES) and X- ray photoelectron spectroscopy(XPS). 用X-射线衍射(XRD)、俄歇电子能谱(AES)和X-光电子能谱(XPS)的方法对N+B离子注入层的相组成、元素的分布和元素的结合状态进行了综合考察。
- Using photoluminescence (PL), X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy, we have analysed GaAs (100) sarfaces passivated with (NH4)2Sx and P2S5/(NH4)2Sx. 利用光致发光谱、X射线光电子谱和俄歇电子谱等技术研究了(NH_4)_2S_x和P_2S_5/(NH_4)_2S_5化学钝化GaAs(100)表面.
- The results of Auger Electron Spectroscopy (AES) and Energy Dispersive Analysis X-ray Spectroscopy(EDAS) measurements show that the interface layer contains Au-Ga intermetallic compound and impurity P,Si. 借助俄歇能谱(AES)和能量色散谱(EDAS)初步分析了Au-Si/n-GaP系统接触的界面含有Au-Ga金属间化合物以及P和Si杂质。
- The samples were studied by X-ray diffraction, Auger electron spectroscopy (AES), X-ray photo electron spectroscopy (ESCA) and catalystic reaction conversion rates at different stages of the pretreatment. 着重分析了预处理对非晶合金催化活性的影响;并以x-射线衍射(XRD);比表面积测定(B.;E
- In present work the distribution of phosphorus in Fe-P-C-Cu-Mo alloy containing 0.6%P and its effect on properties were studied by means of Auger electron spectroscopy, scanning electron microscopy,mechanical properties test machine etc. 本研究利用俄歇能谱、扫描电镜及能谱仪等研究了含0.;6%25磷的Fe-P-C-Cu-Mo合金中磷的分布及其对性能的影响。
- Auger electron spectroscopy(AES),X-ray diffractometer(XRD),scanning electron microscopy(SEM)and X-ray dispersive spectroscopy(EDX)were employed to study the elemental distributions and their possible phases in the. 用俄歇能谱（AES）、X－射线衍射（XRD）、扫描电镜（SEM）及X－射线能谱（EDX）研究了摩擦表面元素组成及其可能物相。
- In this report, interdiffusion of the p-IuP with Au-Zn Ti/Au, Pd/Au, and Ti/Pd/ Au at interface has been investigated by Auger electron spectroscopy and electron spec-troscopy for chemical analysis. 本文用俄歇电子能谱和扫描电子显微镜等方法研究了p-InP与Au-Zn;Ti/Au;Pd/Au和Ti/Pd/Au接触在热处理过程中的互扩散现象.
- It is concluded that combination of SCC tests, polarization curves and Auger electron spectroscopy (AES) analyses is informative for better understanding the SCC mechanism of Fe-Cr-Ni alloys. 电化学测试、SCC试验与表面膜分析相结合的综合研究的结果对于深入理解Fe-Cr-Ni合金的SCC机理、探讨控制SCC的条件和途径以及SCC试验方法的选择等都具有一定的指导意义。
