Morevoer, using the lifetime of free photoelectrons, the optimal doping amount of shallow electron trap dopants was found by analyzing the distribution condition of electron traps in silver halide.

• 以自由光电子寿命为纽带，通过分析掺杂卤化银晶体中电子陷阱的分布情况，可以确定浅电子陷阱掺杂剂的最佳掺杂浓度。