您要查找的是不是：
- The characterization of WN_x/n-GaAs Schottky barriers prepared by magnetron sputteringis investigated using Auger electron spectrum, Rutherford backscattering spetra, current-voltageand capacitance-voltage measurements. 本文用俄歇能谱、卢瑟福背散射、电流-电压和电容-电压等方法研究了射频磁控反应溅射制备的WN_x/n-GaAs肖特基势垒特性。
- DECONVOLUTING CALCULATION OF CVV AUGER ELECTRON SPECTRUM CVV俄歇电子谱的退自卷积计算
- Analysis on diamond crystal growth interface with Auger Electron Spectrum 金刚石单晶生长界面Auger电子能谱分析
- Keywords Uranium;Coating Ti;Oxidation;Electron energy loss spectrum （EELS）;Auger electron spectrum （AES）; 铀表面;钛镀层;氧化;电子能量损失谱;俄歇电子能谱;
- Auger electron spectrum 奥格电子能谱
- Auger Electron Spectra of Al_xGa_(1-x)As/GaAs Heterostructure Grown by LPE 液相外延生长的Al_xGa_(1-x)As/GaAs异质结构的俄歇电子能谱
- Analysis of Auger electron spectrum and infrared absorption spectra of the SiO_xN_y thin dielectric film formed by low temperature PECVD PECVD法低温形成SiO_xN_y介质膜的俄歇电子能谱和红外吸收光谱分析
- Studies on Photoelectrochemistry and Auger Electron Spectra for Inhibitor of Copper in 3% NaCl 3%25NaCl溶液中铜缓蚀剂TTA的光电化学和表面电子能谱研究
- Some fundamental aspects of Auger electron spectroscopy have been reviewed. 介绍了俄歇电子谱术的某些基本问题。
- The surface defects of silver coins was analysed with auger electron spectroscopy (AES), Scanning electronic microscope (SEM) and energy dispersive spectrum (EDS). 采用扫描电镜、能量色散谱和俄歇电子能谱检测方法,对银币表面缺陷进行了分析。
- resulte show that the chemical shifts in Al_2O_3, Sio_2 and MgO can be obtained directly from the ion induced Auger electron spectra, and are in agreement with resnits obtained by-XPS. 从实验上和理论上讨论了离子轰击下,表面上产生的不同于电子激发的俄歇跃迁,提出了用离子感生俄歇确定氧化物中原子内层化学位移的方法,并测得了Al_2O_3、SiO_2和MgO中原子内层的化学位移值,与XPS的测定值相吻合。
- Raman, Auger Electron Spectroscopy (AES) and X ray Photoelectron Spectroscopy (XPS) were used to analyze the samples. 用拉曼谱 (Raman)、俄歇电子能谱 (AES)以及X射线光电子能谱(XPS)等方法对样品进行研究。
- Survival analysis of C6 glioma DNA-targeting radio-therapy by Auger electron emitted from~(125)Iudr in rats. ~(125)IUdR对胶质瘤细胞靶点放疗后的大鼠生存分析
- GaAs-Al_xGa_(1-x)As heterostructure grown by liquid phase epitaxy (LPE) has beenstudied by Auger electron spectroscope. 采用俄歇电子能谱仪(AES)对液相外延生长的GaAs-AlxGa_(1-x)As异质结构进行了研究.
- Analytical device industry: Electron spectrum, Light beam, Accelerator/synchrotron, Spectroscopy. 分析测试仪器行业：电子显微镜、光束线、质谱仪等；
- The Ge mole fraction of 15-16% was determined by Auger electron spectroscopy (AES). 俄歇电子谱(AES)测试表明，所制备的Si_(1-x)Ge_x中Ge含量约为15-16%25。
- The simulation of the Auger electron emissions in scanning probe electron energy spectrometer (SPEES) is reported. 报道了对扫描探针电子能谱仪（SPEES）中俄歇电子出射的理论模拟研究。
- Hot electron spectrum in the interaction of femtosecond laser with solid target was measured in this experiment, and it was carried out on the 100TW laser . 报道了在100TW超短脉冲掺钛宝石激光装置上，完成的飞秒激光-固体靶相互作用中超热电子在靶内输运的实验研究结果。
- The change of Si/Au interface at the Au-modified Si photoelectrode before and after potential sweep was studied with Auger Electron Spectroscopy (AES). 本文报道了用离子剥层俄歇能谱研究Au修饰Si光电极电位扫描前后Si/Au界面的变化。
- The experiments were performed by means of Secondary Ion Mass Spectroscopy (SIMS) and Auger Electron Spectroscopy (AES). 采用了二次离子质谱仪(SIMS)和俄歇电子谱仪(AES)进行表面分析。
