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- Auger electron image 俄歇电子像
- Some fundamental aspects of Auger electron spectroscopy have been reviewed. 介绍了俄歇电子谱术的某些基本问题。
- Raman, Auger Electron Spectroscopy (AES) and X ray Photoelectron Spectroscopy (XPS) were used to analyze the samples. 用拉曼谱 (Raman)、俄歇电子能谱 (AES)以及X射线光电子能谱(XPS)等方法对样品进行研究。
- Survival analysis of C6 glioma DNA-targeting radio-therapy by Auger electron emitted from~(125)Iudr in rats. ~(125)IUdR对胶质瘤细胞靶点放疗后的大鼠生存分析
- Tarn Electronic Image Equipment Co., Ltd. 特霓电子影像设备有限公司。
- GaAs-Al_xGa_(1-x)As heterostructure grown by liquid phase epitaxy (LPE) has beenstudied by Auger electron spectroscope. 采用俄歇电子能谱仪(AES)对液相外延生长的GaAs-AlxGa_(1-x)As异质结构进行了研究.
- The Ge mole fraction of 15-16% was determined by Auger electron spectroscopy (AES). 俄歇电子谱(AES)测试表明，所制备的Si_(1-x)Ge_x中Ge含量约为15-16%25。
- The simulation of the Auger electron emissions in scanning probe electron energy spectrometer (SPEES) is reported. 报道了对扫描探针电子能谱仪（SPEES）中俄歇电子出射的理论模拟研究。
- The change of Si/Au interface at the Au-modified Si photoelectrode before and after potential sweep was studied with Auger Electron Spectroscopy (AES). 本文报道了用离子剥层俄歇能谱研究Au修饰Si光电极电位扫描前后Si/Au界面的变化。
- The experiments were performed by means of Secondary Ion Mass Spectroscopy (SIMS) and Auger Electron Spectroscopy (AES). 采用了二次离子质谱仪(SIMS)和俄歇电子谱仪(AES)进行表面分析。
- The Application of SEM Backscattered Electron Image in Forensic,Sciences Inspection[J]. 引用该论文 丛者唐;刘明辉;余静;徐明华.
- The interface diffusion phenomena of BTO/Si were systematically studied by Auger electron spectroscopy(AES) and X-ray photoelectron spectroscopy(XPS). 通过俄歇电子能谱(AES),X光电子能谱(XPS)等分析手段系统研究了在Si基片上直接生长BTO铁电薄膜过程中的界面扩散现象。
- Some results of quantitative analysis, including depth quantitative analysis, on Model JAMP-10 Auger Electron Mieroprobc are given. 给出了利用JAMP-10型俄歇电子谱仪进行定量分析(包括深度定量分析)的一些结果。
- Objective To calculate the mean absorbed doses at celluar and subcellular levels for uniformly and non-uniformly distributed Auger electron emitters. 目的给出一种新的方法，计算俄歇电子发射核素在细胞中均匀分布和非均匀分布时细胞和细胞核的平均吸收剂量以及吸收剂量在细胞内的分布。
- The composition of surface layer of uranium and treated uranium have been analyzed respectively by Auger Electron Spectroscopy (AES). 用俄歇电子谱(AES)分析了铀试样处理前后表层的成分变化。
- Back-scattering electron image proved that Ag particles disperse on the surface of flake graphite uniformly and the average particle diameter is about 500 nm. 反向散射电子图像证明,银颗粒均匀分散在鳞片石墨表面上,其平均粒径为500nm。
- Abstract The heated oxidation film of U-Nb alloy is studied by auger electron spectroscopy (AES) at different temperature in the high vacuum chamber. 摘要 用俄歇电子能谱(AES)研究了高真空下,环境温度对铀铌合金真空氧化膜的影响。
- The methodical procedure includes that preparing a good dry Bitter pattern on the films surface and then observing by second electron image(SEI)with high resolution. 该方法的步骤是在试样表面制作高质量的干粉纹图,然后用高倍率二次电子象进行观察。
- Auger electron spectroscopy (AES), scanning electron microscopy (SEM) and atomic force microscopy (AFM) are used to analyze component and surface morphology of the films. 用俄歇电子能谱(AES)、扫描电镜(SEM)和原子力显微镜(AFM)对薄膜的组成成分和表面形貌进行了分析。
- The initial oxidation of uranium and uranium samples which were overlapped energy ion-implanted with C ions was studied respectively by Auger electron spectroscopy(AES). 用俄歇电子能谱(AES)分别对高真空室中铀样品及多能量叠加离子注入碳铀样品与氧气吸附及初始氧化过程进行了研究。
