A method for determining the birefringence index,azimuthal angle, and pretilt angle of an anisotropic thin film by measuring the surface plasmon resonance (SPR) device lens/Silver/SiO2 is proposed.

• 本研究系关于一光学晶体折射率及厚度高精度量测系统之研发，本量测系统系由一精密测距雷射干涉仪系统、电动旋转马达搭配数学解析计算所组成。