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- thin film flexural method 薄片弯曲法
- The SnO2/CeO2 thin film was prepared by powder sputter method. 利用粉末溅射,研究了 SnO2/CeO2微型平面薄膜。
- Abbreviation of Thin Film Transistor. 薄膜晶体三极管的缩写。
- A thin film formed on the surface of the pulp. 纸浆表面结了一层膜。
- POLYSILICON THIN FILM FLEXURE HINGE FABRICATED USING SURFACE MICROMACHINING TECHNOLOGY 基于微制造的多晶硅薄膜型柔性铰链
- A new method about measurement complex permittivity of dielectric thin film(um) is present in second part. 由于目前关于薄膜态介质在微波段的介电特性的测量体系还未见报道，在第二部分针对薄膜的特点提出了多介质微扰法测量薄膜介电特性的新方法；
- LiMn2O4 thin film was prepared on the stainless steel substrate by the sol-gel method using a spin coa-ter. 对采用溶胶凝胶涂覆法在不锈钢基片上制备锰酸锂(LiMn2O4)薄膜进行了初步研究.
- In this paper, we presented the epitaxial growth of CeO2 thin film on cube textured Ni5W substrates by MOD method. 本文采用MOD方法,以有机铈盐配制前驱溶液,在立方织构的Ni-5%25(原子分数)W基底上制备了CeO2过渡层。
- Asphalt Thin Film Oven Test Method is an important inspection item of heavy traffic paving asphalt and paving asphalt. 石油沥青薄膜烘箱试验是重交通道路石油沥青和道路石油沥青的重要检测项目之一。
- A new experiment of measuring modulus of elasticity with the flexural method on the experiment device of CSY sensor system is introduced. 本文介绍在CSY型传感器系统实验仪上扩展用弯曲法测材料弹性模量新实验。
- Yang interference of double slits, thin film interference. 杨氏双缝干涉。薄膜干涉。
- This is the output terminal of a thin film transistor (TFT). 这是末端一只薄膜晶体三极管的生产(TFT).
- Design of Interleaver with Cascaded Thin Film Filter[J]. 引用该论文 陈海星;顾培夫;李海峰;章岳光;沈伟东.
- The Evaluation of Mechanical Properties of Thin Film by Multilayer Microbridge Testing Method[J]. 引用该论文 周志敏;周勇;曹莹;丁文;毛海平.
- A uniaxial tensile test method for measuring mechanical properties of MEMS thin film materials is presented. 介绍了一种用于MEMS薄膜材料力学特性测试的单轴拉伸试验方法。
- Suzhou NSG AFC THIN FILMS ELECTRONICS CO., LTD. 苏州美日薄膜电子有限公司。
- The CMR effect of the thin films was investigated . 研究了La_(1-x)Te_xMnO_3薄膜的CMR效应。
- A patterned DLC thin film cath ode was fabricated by reactive -ion etching method and mic ro -fabrication technology. 通过离子束技术和微细加工技术可以实现DLC薄膜的图形化并能大大提高薄膜的场发射性能。
- Nanocomposite thin films PT／PEK-C were prepared. 制备了纳米复合材料薄膜PT／PEK-C。
- The three-wavelength optical interferometric method was presented to measure the thickness of the nano-scale thin film. 给出三波长光干涉测量纳米级薄膜厚度的方法。
