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- scarming probe microscopy 扫描探针显微镜
- Scanning probe microscopy (SPM) related surface science and nanotechnology. 与扫描探针有关的表面科学和纳米技术.
- Meyer E,Hug H J,Bennewitz R.Scanning Probe Microscopy[M].Springer,2003-04. 白春礼.;扫描隧道显微术及其应用[M]
- Dawn A. Bonnell, Sanning Probe Microscopy and Spectroscopy: Theory, Techniques, and Applications, Wiley-VCH, 2000. 伍秀菁,汪若文,林美吟编辑，微机电系统技术与应用，行政院国家科学委员会精密仪器中心，2003年
- Photon Scanning Tunneling Microscopy (PSTM ) is a kind of scanning probe microscopy with high resolution. 光子扫描隧道显微镜(PSTM)是一种高分辨率的扫描探针式显微镜。
- When Scanning Probe Microscopy (SPM) is used as a nanomanipulation tool, its lack of real-time sensory feedback has hindered its wide application. 摘要当利用扫描隧道显微镜(SPM)作为一种纳米操作工具时，由于其缺乏实时的传感器信息反馈，而大大阻碍了它的广泛应用。
- Cooperating with X-Y piezo-electrical scanner, and operating under the same mechanism of TM-AFM, the novel stylus was used to construct a scanning probe microscopy. 该新型测头与X-Y压电工作台结合,采用与TM-AFM相同的工作原理,构成了扫描探针显微镜。
- These unique one-dimensional materials have potential uses in nanoelectronics, nanophotonics, super high density recording, and scanning probe microscopy. 这些具有独特性质的一维纳米材料在纳米电子学、纳米光电子学、超高密度存储和扫描探针显微镜等领域有着潜在的应用前景。
- The film and its surface morphologies of amino-polysiloxane were observed and studied by means of atomic force probe microscopy(AFM) and contact angle measurement instrument. 应用原子力显微镜(AFM)和接触角测量仪对乙酸酐改性氨基聚硅氧烷的成膜性及膜形态进行了研究。
- The film and its surface morphologies of amino-polysiloxane were observed and studied by means of atomic force probe microscopy (AFM) and contact angle measurement instrument. 摘要应用原子力显微镜(AFM)和接触角测量仪对乙酸酐改性氨基聚硅氧烷的成膜性及膜形态进行了研究。
- However, a new member of the scanning probe microscopy (SPM) family, atomic-force acoustic microscopy(AFAM), provides the solution to several long-standing problems. 原子力声学显微镜（AFAM）为一些长期存在的问题提供了有效的解决办法。
- FTIR-spectroscopy,UV-vis spectroscopy,scanning probe microscopy and contact angle measurement were used to measure the properties of the silica coatings. 采用红外光谱、分光光度计、扫描探针显微镜和静滴接触角测量仪等测试手段分析了薄膜的特性。
- This course introduces the principles and application of scanning probe microscopy (SPM), including atomic force microscopy (AFM) and scanning tunneling microscopy (STM). 本课程介绍扫瞄探针显微术（SPM，包括原子力显微术AFM及扫瞄隧穿显微术STM）之原理及应用。
- Carbon nanotube has been expected to be a suitable material to the apex of scanning probe microscopy (SPM) tips because of its unique physical properties and special structures. 碳纳米管由于特殊的空间结构和突出的物理性能而广泛用于各类扫描探针显微镜。
- Amino-polysiloxane film surface morphologies were observed and its arrangement manner were also studied by means of atomic force probe microscopy (AFM) and contact angle measurement instrument. 摘要用原子力显微镜(AFM)和接触角测量仪对丁内酯改性氨基聚硅氧烷的膜形貌及其排列方式进行研究，并与应用性能进行分析。
- A novel design of self-adjusting PI controller was designed to solve the problem that the parameters of the traditional controller in scanning probe microscopy(SPM) are difficult to be adjusted. 为了解决传统扫描探针显微镜(SPM)控制器中参数难以设定的难题,提出了一种SPM的PI参数自整定控制器的设计,并给出了控制器的硬件结构和软件设计。
- Ultra-High Vacuum Scanning Probe Microscopy 超高真空扫描探针显微镜系统
- C60;C70;scanning probe microscopy;NCH3;CH3 碳六十;碳七十;扫瞄探针显微术;氮甲基;甲基
- Abstract The multi-function open scanning probe microscopy 扫描探针显微镜
- Application of Scanning Probe Microscopy in Nano Technology 扫描探针显微术及其在纳米科技中的应用
