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- compatible compression of multiple scan chains 多扫描链相容压缩
- Configuration of Multiple Scan Chains in Full Scan Design 全扫描设计中多扫描链的构造
- Constraint Input Reduction BIST Scheme for Multiple Scan Chains 约束输入精简的多扫描链BIST方案
- Test Pattern Generation in Built-In Self-Test with Multiple Scan Chains 基于多扫描链的内建自测试技术中的测试向量生成
- Distance-marking compression method based on compatible compression of multiple scan chains 基于多扫描链相容压缩的距离标记压缩方法
- multiple scan chains 多扫描链
- Scan chain partition separates a scan into two or more chains. 扫描链分割技术即将单一条扫描链分割为两条以上。
- Scan chain reordering changes the order of scan cells. 扫描链重排技术即改变扫描正反器之排列顺序。
- FAQ.To address this issue, we now have multiple scanner support. 为了解决这个问题，就有了对多扫描器的支持。
- This paper presents a novel test scheduling solution, unlike previous techniques that take advantage of balanced scan chains of every single core, utilizing the balance of pairwise combined cores. 不同于以往基于单个芯核扫描链平衡的调度技术,本文提出的对平衡调度技术是利用两个芯核配对后扫描链可能比单个芯核扫描链更平衡,获得比单平衡更短的测试时间。
- Scan chain reordering improves diagnosis resolutions by breaking the continuous unobservable scan cells. 扫描链重排技术可藉由打断连续之不可观察的扫描正反器来改善诊断解析度。
- Scan chain partition improves diagnosis resolutions by solving controllability problems and observability problems. 扫描链分割技术可藉由解决可控制性问题及可观察性问题来改善诊断解析度。
- The penalty of this technique is area and routing overhead for scan chain reordering. 此技术需要付出的代价是扫瞄链重排的额外的面积和绕线。
- Cluster-based reordering is supported to improve the scan chain wiring overhead. 为降低扫描链重排所造成之绕线增加，本研究亦支援以丛集为基础之重排技术。
- Scan chain partition and reordering techniques are proposed to improve the diagnosis resolutions of scan chain single stuck-at faults. 摘要:为改善扫描链之单一黏著性错误之诊断解析度，本研究提出扫描链之分割与重排技术。
- Multiple scanning profiles can be created with various sets of options selected for various situations. 多剖面扫描,可以产生不同的选择,选择不同的情况。
- Multiple scans and doses of antibiotics later, the pneumonia was reclassified as a lung tumor and the brain lesions as metastases. 承后多次扫描和抗生素剂量，肺炎被重新诊断为肺肿，脑损害被诊断为转移瘤。
- EICM cuts down the scan time and the scan chain's bad effect on critical path.The time on testing chip can be reduced greatly, and the development process of digital signal processor becomes faster. 该模拟器减少了扫描时间和扫描链对关键路径的影响，加快了芯片的测试速度和开发进程。
- Recently, a low power scan chain design technique based on clustering and reordering of scan cells is proposed in [15], which effectively reduces the power consumption and the wire length. 近年来，[15]中提出了一个低功率扫描鍊设计技术，这项技术有效的降低了耗电以及导线长度。
- The doctors gave him an ultrasonic brain scan. 医生给他做了脑部超声波扫描检查。
