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- metrological AFM of nanomeasuring system 计量型原子力显微镜纳米测量系统
- Realization of a Large Range Metrological AFM using NMM 利用纳米测量机实现大范围的计量型原子力显微镜
- metrological AFM 计量型原子力显微镜
- Ip-label develops and maintains a vast metrological network. ip-label开发维护了一个强大的计量网络。
- The films were characterized with XPS, AFM, SEM, and XRD technique. 对薄膜进行了XPS;AFM;SEM和XRD分析.
- In charge of metrological verification etc. Management works. 职能:负责全站计量检定业务管理工作。
- The morphology of SnO2: Sb thin films was researched by AFM. 采用AFM分析了SnO_2:Sb的表面形貌。
- AFM was my initial impression of managment: another effing meeting. AFM是我对管理的最初之印象:又是一次鬼会议。
- Literature metrological analysis of phytotaxonomy method. 植物分类方法的文献计量分析.
- Fig. 6 AFM image of standard particle arrays specimen. 图6标准粒子排列样品的AFM图像。
- Our results show that AFM is a powerful method in the study of DMs. 实验结果表明原子力显微术是研究双微体的一种有效手段。
- AFM based femto-second laser nanofabrication of PMMA[J]. 引用该论文 黄文浩;朱兰芳;陈宇航;言峰;周明;王翔.
- At last, the principle of the AFM and MFM are also presented. 最后给出原子力显微镜和磁性显微镜的工作原理。
- To develop metrological techniques for tooling measurements and inspection. 为模具测量和检测开发度量衡技术。
- It should not be considered that NDT equipments are metrological instrument. 因此,不能认定这些普通无损检测仪器全是计量器具。
- What we will have to do is we will have to adapt the metrological conditions. 我们将要做的事情是适应这种气候条件。
- AFM images indicated that the medium particle size of the film was about 16nm. AFM观察得出;薄膜的平均晶粒粒径大约16nm.
- The size of the nano-crystallites was between 20 and 60 nm as measured by AFM. 根据AFM测量,纳米晶尺寸在20-60纳米之间。
- Several imaging factors of atomic force microscope (AFM) were explored. 对原子力显微镜(atomic force microscope,AFM)的成像技术进行了多方面探索;
- The surface morphology are studied using atomic force microscopy (AFM). 表面形貌用原子力显微镜(AFM)进行分析。