in this paper,we present nondestructive testing, surface thin layer analysis and rapid semiquantitative analysis by plane grating spectrograph, EDXRF spectrometer and ICP spectronleter etc.

• 本文报道了应用X荧光光谱仪，ICP单道扫描光谱仪等检测方法开展无损检测、材料的表面薄层分析和快速半定量分析。