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- high resolution diffraction 高分辨衍射
- Relaxation and Ge content are investigated with high resolution X-ray diffraction,SIMS,and AFM. 利用高分辨X射线、二次离子质谱仪和原子力显微镜分别对薄膜的晶体质量、厚度以及平整度进行了分析.
- The morphology of the carbon nano onion-like Fullerenes was examined and characterized by high resolution electron microscopy and X-ray diffraction. 利用高分辨电子显微镜对其进行了观察和表征。
- High resolution background moving picture. 高分辩率背景视频动态画面。
- High resolution digital reading eyepiece. 高分辨率的数字式读数目镜。
- High resolution laser marking /engraving machines. 高分辨率激光标记/雕刻机器。
- It is shown by means of electron diffraction and high resolution lattice imaging that there are 9R, 10H, 16H, 20H, 21R, 44H and 2H structures in cast Ni3 (Ti x,V1-x) alloys. 本文利用电子衍射及高分辨点阵象实验方法证实了Ni_3(Ti_x,V_(1-x))合金系在铸态下存在有9R,10H,16H,20H,21H,44H等长周期结构以及2H结构。
- The carbonated tree in volcanic breccia has been studied through high resolution transmission electronic microscopy (HRTEM),X-ray powder diffraction and laser Raman spectroscopy. 对浙江温岭火山角砾岩中的碳化树木进行了高分辨电子显微镜、X粉晶衍射和激光拉曼光谱研究。
- Very high resolution and detail capture throughout the zoom range! 在整个变焦范围内都有很高的分辨率和细节捕获能力!
- High resolution inspecting investigation for inner defect of SRM. 固体火箭发动机内部缺陷高分辨率检测。
- Low energy monochromator with high resolution and flux. 高分辨和高流强的低能单色器。
- Sets to the High Resolution Mode that supports the Progressive. 设置高清晰模式来支持连续模式。
- Sets to the high Resolution Mode that support the Progressive. 智能:设置高清晰模式来支持连续模式。
- Inbuilt high resolution camera for sample monitoring at any time. 内置高清晰摄像头，方便用户监测样品。
- Multispectral and high resolution images fusion is presented. 论文对多光谱图像和高分辨图像进行了融合。
- All internal controls are compatible with high resolution screens. 所有的内部控件支持高分辨率的屏幕。
- Click on image to get higher resolution. 点击图片得到更高的解像度。
- Components and structures of the final products were characterized with X ray diffraction (XRD), high resolution transmission electron microscopy (HRTEM), X ray energy dispersive spectra and selected area electron diffraction (SAED). 通过X射线衍射(XRD);高分辨率透射电镜(HRTEM);X射线能散射谱(EDX)及选区电子衍射(SAED)等手段对产物进行了组成和结构表征.
- High resolution electron microscopy (HKEM) and electron diffraction pattern (EDP) indicated that there are three phases in the material which can be represented by Phase A, B and C, respectively. 高分辨电子显微术(HREM)及电子衍射图(EDP)分析表明,在这种材料中存在三种相,分别用A、B、C来表示。
- The shear strain and strain of MBE grown CdTe(211)B epilayers on 3inch Si(211) substrates are measured using reciprocal space maps in the symmetric and asymmetric reflection by high resolution X-ray diffraction. 文章利用高分辨率X射线衍射技术对分子束外延CdTe(211)B/Si(211)材料的CdTe外延薄膜进行了倒易点二维扫描,并通过获得的对称衍射面和非对称衍射面的倒易空间图,对CdTe外延层的剪切应变和正应变状况进行了分析。
