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- field ion mass spectrum 场致离子质谱
- By comparing the product ion mass spectra of oxypaeoniflorin with those of the unknown component under different collision energy, basic structure unit of the unknown component was determined. 通过比较不同碰撞能量下的未知化合物子和氧化芍药甙的离子碎片,确定了未知化合物的基本结构单元。
- field ion mass spectroscopy 场离子质谱学
- secondary ion mass spectrum 二次离子质谱
- ion mass spectrum analyzer 离子质谱分析仪
- negative ion mass spectrum 负离子质谱
- ion mass spectrum 离子质谱
- positive ion mass spectrum 正离子质谱
- The HPLC was subjected to gradient elution and negtive ion mode was adopted in mass spectrum. 高效液相色谱用梯度洗脱,质谱用负离子模式。
- Its stucture was investigated through IR,1H NMR and mass spectrum. 用红外光谱、核磁共振氢谱和质谱推测了产物的结构。
- The results showed that the molecular ion peak of Aris A A is rather strong in the mass spectrum,the detection limit is 5 ng(signal to noise ratio=10). The sensitivity is high enough to determine Aris A A in CTPM. 测定结果表明;马兜铃酸A的质谱有较强的分子离子峰;最低检测限为5 ng(信噪比等于10);可以满足对中成药中马兜铃酸A测定之要求.
- Abstract Secondary Ion Mass Spectrometry (SIMS) is a new analytical techniquefor labile, nonvolatile organic compounds. 摘要 二次离子质谱法(SIMS)是一种分析易热解和不挥发的有机化合物的新技术。
- Abstract Secondary ion mass spectrometry(SIMS) is more sensitive than other surface microregion analysis instrumentals. 摘要 二次离子质谱 ( SIMS)比其他表面微区分析方法更灵敏。
- Time-of-Flight secondary ion mass spectrometry (TOF-SIMS) is a very sensitive surface analytical technique, well established for many industrial and research applications. 飞行时间二次离子质谱(TOF-SIMS)是一种非常灵敏的表面检测技术。
- Meanwhile, MS peaks with +3, +4, +5, +6 and +7 charges were formed in mass spectrum under the ESI positive scan mode. 同时在ESI正离子全范围扫描中主要形成带有+3、+4、+5、+6、+7等不同电荷数的质谱峰。
- The experiments were performed by means of Secondary Ion Mass Spectroscopy (SIMS) and Auger Electron Spectroscopy (AES). 采用了二次离子质谱仪(SIMS)和俄歇电子谱仪(AES)进行表面分析。
- Dipentene of different origin were analysed by GC-MC and computer autometic request mass spectrum. 采用气质联用仪，微机图谱自动检索对不同来源的双戊烯的化学组成进行了分析。
- field ion transmission microscope 场致离子透射显微镜
- Aim:To determine the mass spectrum and the mass spectrometric decomposition process of azodiisobutyronitrile. 目的：确定偶氮二异丁腈的质谱图及其质谱碎裂机理。
- The Secondary Ion Mass Spectrometer (SIMS). especially dynamic SIMS. is the most suitable instrument for particle isotopic analysis. 动态型二次离子质谱(SIMS)是进行微粒同位素分析最适用的测量仪器之一。
