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- double probe testing method 双探头探伤法
- method, double probe testing 双探头探伤法
- single probe testing method 单探头探伤法
- FourPoint Probe Test equipment used to test resistivity of wafers. 四探针测量半导体晶片表面电阻的设备。
- The plasma produced by an electric discharge of helium with the pressure range 100~700 Pa in a closed cavity is diagnosed by this way at three frequencies of 6.2,6.8 and 7.4 GHz. As a comparison,the Langmuir double probe method is used at the same time. 使用该方法对100~700 Pa范围内氦气辉光放电等离子体进行了诊断;选择6.;2;6
- Conduct testing method transfer from other labs. 执行从其他实验室检验方法的转移。
- Q BD testing method is described. 并同时绘出了QBD的测试方法。
- Testing method of AATCC 167 is briefly introduced. 美国AATCC有关于《分散染料的起泡倾向》的测试方法(AATCC 167)的介绍。
- With a Langmuir double probe,the plasma s properties have been studied preliminarily. 利用朗廖尔双探针法初步研究了该螺旋波等离子体的特性。
- Participate new compatibility test method research. 参与新的兼容性测试方法的研究。
- This attribute can be specified on a test method. 可以在测试方法上指定此属性。
- Add test code to the test method. 为测试方法添加测试代码。
- Test method has MIT method and Schopper method. 检验方法有MIT法和肖伯尔法。
- Accessibility of a live part shall be determined by the articulate probe test of Clause 14.4 during user maintenance and normal operation. 带电部件的可接触性应取决于用户在维护和正常使用过程中用高灵敏度的探针测试的结果,如第14.;4条所述。
- In this paper an investigation has been made into rail surface defects by way of metallographical test and electronic probe test. 采用金相检验和电子探针的方法,对钢轨表面缺陷进行了检验分析。
- Finally, the waveguide-microstrip double probe transition is used as the combination network, while HMC28 and TGA1141-EPU are used as amplifying units, for the actual Ka-band power combination amplifier. 最后,结合目前的工艺水平,采用波导-微带双探针过渡结构作为合成网络形式,采用HMC283 和TGA1141-EPU 作为放大单元,实现了Ka 频段功率合成放大器的设计、制作和测试。
- Detail training on major safety test method and judgement. 重点讲述常见安规测试的合格判定及问题处理。
- He pioneered several new testing methods. 他首创了几条新的测试方法。
- Footwear - Test method for shanks - Fatigue resistance. 鞋。支架的试验方法。耐疲劳性。
- A Manual Contact CMM with Double Probe 双测头接触式手动坐标测量机床