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- In addition, we designed JTAG emulator to support the debug structure based on JTAG boundary scan. 此外,为了支持JTAG接口调试,我们设计了JTAG仿真器。
- Electrical test such as ICT, boundary scan and functional test (FT) mainly detect faults. 诸如ICT、边界扫描和功能测试（FT）等电气测试主要用于检测这些故障。
- By using Boundary Scan,this paper researches on BIST of a CUT,which is a core circuit of a domestic product. 从国内厂家一个实际的内核电路出发，对其进行BIST插入及边界扫描测试的研究；
- The automatic testing software which is compatible with BSDL files and EDIF files can complete multiple boundary scan test tasks. 兼容于BSDL和EDIF文件格式的自动测试向量生成软件可实现多种扫描测试功能。
- The introduction of module test and maintenance bus(MTM-Bus) has taken much convenience to the hierarchical boundary scan test technology. 模块测试与维护总线(MTM-Bus)给层次化边界扫描测试技术提供了方便。
- Cannot add any more scanning mode. 无法添加更多的扫描模式。
- When performing boundary scan on integrated circuits, the signals manipulated are between different functional blocks of the chip, rather than between different chips. 当在集成电路中进行边界扫描时,被处理的信号是在同一块芯片的不同功能模块间的,而不是不同芯片之间的。
- The scan mode is set to LIMITED for best performance and to limit the statistics that are returned. 为了获得最佳性能并限制返回的统计信息,扫描模式设置为。
- Using this BSM, we can solve some practical problems in the research works, and also achieved a good compatibility with non standard boundary scan test types. 采用这样的设计可以使得整个测试控制过程获得更好的兼容性、扩展性与灵活性 ,并且解决了测试中遇到的一些实际问题。
- So the design of boundary scan is essential in the design of chips. IEEE instituted a standard for it, and the standard is IEEE1149.1 (that can be called as JTAG standard also). 边界扫描设计已逐渐成为芯片设计中不可或缺的部分;IEEE为其制定了相关标准;即IEEE1149.;1标准(也称为JTAG 标准)。
- Meanwhile, MS peaks with +3, +4, +5, +6 and +7 charges were formed in mass spectrum under the ESI positive scan mode. 同时在ESI正离子全范围扫描中主要形成带有+3、+4、+5、+6、+7等不同电荷数的质谱峰。
- Using this BSM, we can solve some practical problems in the research works, and also achieved a good compatibility with non-standard boundary scan test types. 采用这样的设计可以使得整个测试控制过程获得更好的兼容性、扩展性与灵活性，并且解决了测试中遇到的一些实际问题。
- Industrial computed tomography (ICT) adopts generation III scan mode to execute the rapid test of objects. 工业CT即ICT(Industrial Computed Tomography)采用三代扫描方式对构件进行快速检测.
- The part-BS PCB boards composed of BS chips and non-BS chips will exist widely for a long time, how to test these boards using boundary scan technique remains a key problem. 摘要由BS器件和非BS器件组装的非完全BS电路板仍在今后相当时间广泛存在，如何对它们应用边界扫描测试是板级边界扫描测试技术需要研究的关键问题。
- The BSDL language that describes boundary scan components is thoroughly studied, and then applied to boundary scan ATPG tools and fault diagnosis software. 摘要在对描述器件边界扫描特性的BSDL语言进行了深入研究之后，将其应用于边界扫描自动测试图形生成ATPG与故障诊断软件中。
- The mechanism to request and receive the Bluetooth address, clock, class of device, used page scan mode, and names of devices. 设备发现。一种请求和接收蓝牙地址,时钟,设备类别等的机制。
- Anlysis shows that the scan field of view along the horizon can be improved no less than 80% compared with cone-beam 3D-CT based on FDK and circular orbit scan mode. 分析表明,其水平方向的有效扫描视野比基于FDK的圆轨道锥束扫描三维CT提高了80%25以上。
- In this paper, some optimal design methods for testability were proposed firstly, and then the principle and process of boundary scan test on part-BS boards were showed by way of illustration. 本文从非完全BS电路板的测试性优化设计入手，举例说明了基于边界扫描的非完全BS电路板测试诊断技术的原理和过程。
- From the result of test we can see, the system-level test based on boundary scan can been applied in modern electronic equipments, especially the MTM-BUS is quickly, accurate and simple. 实验结果表明，基于边界扫描的系统级测试技术能够广泛应用于现代电子设备，特别是MTM-BUS总线结构具有快速、准确、简单等特点。
- From the result of test we can see, the system-level test based on boundary scan can be applied in modern electronic equipments, especially the MTM-BUS is quick, accurate and simple. 实验结果表明，基于边界扫描的系统级测试技术能够广泛应用于现代电子设备，特别是MTM-BUS总线结构具有快速、准确、简单等特点；
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