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- The introduction of module test and maintenance bus(MTM-Bus) has taken much convenience to the hierarchical boundary scan test technology. 模块测试与维护总线(MTM-Bus)给层次化边界扫描测试技术提供了方便。
- Using this BSM, we can solve some practical problems in the research works, and also achieved a good compatibility with non standard boundary scan test types. 采用这样的设计可以使得整个测试控制过程获得更好的兼容性、扩展性与灵活性 ,并且解决了测试中遇到的一些实际问题。
- Using this BSM, we can solve some practical problems in the research works, and also achieved a good compatibility with non-standard boundary scan test types. 采用这样的设计可以使得整个测试控制过程获得更好的兼容性、扩展性与灵活性，并且解决了测试中遇到的一些实际问题。
- The automatic testing software which is compatible with BSDL files and EDIF files can complete multiple boundary scan test tasks. 兼容于BSDL和EDIF文件格式的自动测试向量生成软件可实现多种扫描测试功能。
- Boundary Scan Test Technology and its Applications 边界扫描测试技术及其应用
- In this paper, some optimal design methods for testability were proposed firstly, and then the principle and process of boundary scan test on part-BS boards were showed by way of illustration. 本文从非完全BS电路板的测试性优化设计入手，举例说明了基于边界扫描的非完全BS电路板测试诊断技术的原理和过程。
- The design of a BSM is the key problem of the implementation of the Boundary Scanning Test System implementation. 主控器设计是边界扫描测试系统设计的重点。
- We practiced a special structure of a BSM based on the instruction-expanded design.The instruction set was chosen carefully by studying the Boundary Scanning test standard. 这里介绍了一种基于指令模块的主控器体系结构，它的指令集的选择依照边界扫描规范并从中提取出最基本的控制方式，具有指令扩展功能。
- A Study of Boundary Scan Test Technique for Integrated PCB 系统集成芯片边界扫描测试技术研究
- l Design testing logic circuit, including: Memory BIST, scan insertion boundary scan test, delay test, macro test; 设计测试用逻辑电路，包括：库BIST，扫描插入边界扫描测试，延迟测试，宏测试；
- boundary scan test 边界扫描测试
- boundary scan test technology 边界扫描测试技术
- Electrical test such as ICT, boundary scan and functional test (FT) mainly detect faults. 诸如ICT、边界扫描和功能测试（FT）等电气测试主要用于检测这些故障。
- The part-BS PCB boards composed of BS chips and non-BS chips will exist widely for a long time, how to test these boards using boundary scan technique remains a key problem. 摘要由BS器件和非BS器件组装的非完全BS电路板仍在今后相当时间广泛存在，如何对它们应用边界扫描测试是板级边界扫描测试技术需要研究的关键问题。
- boundary scan testing 边界扫描法测试
- In addition, we designed JTAG emulator to support the debug structure based on JTAG boundary scan. 此外,为了支持JTAG接口调试,我们设计了JTAG仿真器。
- By using Boundary Scan,this paper researches on BIST of a CUT,which is a core circuit of a domestic product. 从国内厂家一个实际的内核电路出发，对其进行BIST插入及边界扫描测试的研究；
- From the result of test we can see, the system-level test based on boundary scan can been applied in modern electronic equipments, especially the MTM-BUS is quickly, accurate and simple. 实验结果表明，基于边界扫描的系统级测试技术能够广泛应用于现代电子设备，特别是MTM-BUS总线结构具有快速、准确、简单等特点。
- From the result of test we can see, the system-level test based on boundary scan can be applied in modern electronic equipments, especially the MTM-BUS is quick, accurate and simple. 实验结果表明，基于边界扫描的系统级测试技术能够广泛应用于现代电子设备，特别是MTM-BUS总线结构具有快速、准确、简单等特点；
- When performing boundary scan on integrated circuits, the signals manipulated are between different functional blocks of the chip, rather than between different chips. 当在集成电路中进行边界扫描时,被处理的信号是在同一块芯片的不同功能模块间的,而不是不同芯片之间的。
