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- automatic test generation system 自动测试生成系统
- Automatic test generation based on hierarchical finite state machines 基于分层有限状态自动机的一致性测试生成
- automatic test generation 自动测试生成
- VATE? Versatile Automatic Test Equipment? 万用自动检测设备?
- An automatic test pattern generation (ATPG) algorithm for deliberately selected delay faults is presented to cope with the crosstalk-induced delay effects on longer paths. 由于电路中较长的通路具有较短的松弛时间,因此容易因为串扰问题产生时延故障。
- US manufacturer of automatic test equipment widely used in ST. 美国自动测试设备制造商,其产品在意法半导体广泛使用。
- The produce of LXI signs a new change in automatic test field. LXI是仪器领域中又一个新的发展方向,是下一代新型平台的主体。
- Based on the research about Graphic Theory and Data Flow Test Theory, an automatic test sequences generation algorithm (BDF-SGA) is proposed by the author. 根据对图论和数据流测试理论的研究,本文提出了基于数据流测试准则的测试序列自动生成算法(BDF-SGA算法)。
- Able to use automatic testing tools is a plus. 会用自动测试工具者优先。
- Able to use automatic testing tools. 会用自动测试工具。
- On the other hand, incrementing K also increases the probability of overlapping, hindering the test generation process. 就另一方面而言,增加K块区域且增加重叠的可能性,也阻挡了测试生成过程。
- automatic testing generation 自动测试生成
- The simulation results show that it is available to use chaotic search for I(subscript DDT) test generation. 模拟实验结果表明,将这种方法用于瞬态电流测试产生是可行的。
- Fourthly, we describe the usage of DC parameters automatic test system of VLSI. 第四、叙述VLSI直流参数自动测试系统的使用方法。
- By using backtrace and backtrack of FAN algorithm, the efficiency of test generation algorithm has be improved. 利用了FAN算法的多路回退和回溯等主要特色,提高了测试生成算法的效率。
- Unit test generation does not automatically add the AspNetDevelopmentServer attribute or the TryUrlRedirection method call. 单元测试生成不会自动添加AspNetDevelopmentServer属性或TryUrlRedirection方法调用。
- This paper focuses on automatic test data generation for path testing using genetic alg. 本文主要研究的是路径测试数据的自动生成方法。
- Low coverage indicates a process problem, which might require test generation technique to be improved, or training to be imparted to the tester. 低的覆盖率表明方法有问题,可能是测试生成技术需要改进,也可能需要给测试人员提供培训。
- Bai, Andre, et.al., 1998: Fast Antirandom (FAR) Test Generation to Improve Code Coverage. Software Research Institute. SanFrancisco, CA, USA. 何淼等,1995:板齿鼠种群中长期预测的时间序列模型。走向21世纪的中国生态学。中国生态学会。
- It is simple and eliminates the complicated timing issue during test generation for the crosstalk fault in the conventional approaches. 此方法简单且消除了传统方法在产生串音障碍测试图样时的复杂时间考量。