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- ATE Towards Nano IC Testing 面向纳米IC测试的ATE
- With development of the semiconductors industry and appearance of new ASIC, SOC devices the paper analyzes new requirement and challenge proposed by IC test, and described new solution of the ATE and new system feature also. 本文从半导体产业的飞速发展 ,新型集成电路ASIC、SOC等器件的出现 ,分析了对IC测试提出的新要求和挑战。 阐述了ATE(自动测试设备 )产业可采取的新的解决方案及新型测试系统的性能与特点。
- CMOS device dimensions scale down to the very deep submicrometer.ICs are going towards higher density, higher speed and lower power dissipation making new challenges on IC test and design for test. 摘要CMOS器件进入超深亚微米阶段,集成电路(IC)继续向高集成度、高速度、低功耗发展,使得IC在测试和可测试性设计上都面临新的挑战。
- This paper introduces the verification method of ASL3000 IC test system. 摘要介绍了ASL3000集成电路测试系统的检定方法。
- Agape Package Manufacturing (Shanghai) Ltd. is an IC testing and assembly house jointly funded by USA, Japan, Taiwan and Hong Kong-based investors. 葵和精密电子(上海)有限公司是一家由美国,日本,台湾及香港的投资者联合出资成立的IC封测企业。
- Analysing the capability of IC test in ATES, Points out requiring to solve theproblems based on Bill Transmitter Order(BTO), and then discusses the operation tactics ofIC test. 分析了ATES测试的生产能力,指出了测试生产中的不足之处,最后阐述了IC测试运作策略。
- Now we focus on IC test handler, it's production included most of the assembly types, for example DIP,SOP,SSOP,TSSOP,QFP,TO series,QFN etc. 目前主要生产集成电路分选机,产品品种涵盖目前市场上的绝大多数封装品种,如DIP,SOP,SSOP,TSSOP,QFP,TO系列等。
- At last, an effective solution to the synchronization of digital and analog mixed signal IC test system is found so that the test system works accurately, stably and reliably. 提出了解决数模混合信号集成电路测试系统同步问题的有效方案,使数模混合信号集成电路测试系统准确、稳定和可靠。
- I'll try and rustle you up something to eat. 我设法给你弄点吃的。
- A Discussion on IEEE Standards Concerning IC Test 集成电路测试相关标准研究与探讨
- Study on Silicon-gate CMOS IC Test Pattern 硅栅CMOS集成电路测试图形的研究
- A mother naturally feels protective towards her children. 母亲对自己的孩子自然会悉心保护。
- It's natural to slack2 off towards the end of a hard day's work. 一天紧张工作快结束的时候有些放松是自然的。
- This article introduced the basic conception of combined digital IC, including classification of digital IC test, controllability, observation, testability, fault, limitation and invalidation etc. 摘要介绍了数字集成电路测试的基本概念,包括测试的分类,以及可控性、可观性、可测性、故障、失效和缺陷等概念;
- Cancer ate away his healthy flesh. 癌症侵害了他健康的肌体。
- I ate breakfast and dinner but nothing between. 我在早餐和正餐之间不吃东西。
- The queue of prisoners shuffled towards the door. 那队囚犯拖着沉重的步子向门口蹭去。
- At twelve-fifty, he ate lunch in a restaurant. 他十二点五十分在餐厅吃午餐。
- He dashed across the street and ran towards me. 他冲过马路,向我跑过来。
- He was walking towards town when I met him. 我遇到他时,他正往镇上走去。