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- 软X射线能谱Soft X-ray spectrum
- INCA-X射线能谱仪INCA X-ray energy dispersive spectrometer
- 喷气式Z箍缩等离子体辐射软X射线能谱的研究Study of soft X-ray energy spectra from gas-puff Z-pinch plasma
- 扫描电镜及X射线能谱仪在首饰镀层检测中的应用APPLICATION OF SEM AND EDS IN INSPECTION OF PLATING ORNAMENTS
- 膜上沙尘粒子的电子显微镜照片和它的X射线能谱(沙尘1样品)Electron micrograph of a dust particle on nitron-barium chloride film and its X-ray spectrum (sample of case 1)
- 用扫描电镜和X射线能谱仪分析研究了半导体器件键合用金丝的断口。Fracture surfaces of gold wire used for bonding semiconductor devices are researched by Scanning Electron Microscope (SEM) and Energy Dispersive Analysis of X-ray (EDX) .
- Ｘ射线能谱仪X-ray energy spectrometer
- X射线光电子能谱X-ray photoelectron spectroscopy
- α射线能谱学α-ray spectrometry
- α射线能谱alpha ray spectrum
- 变角X射线光电子能谱ADXPS
- 射线能谱学gamma spectroscopy
- α射线能谱仪alpha-ray spectrometer
- 连续谱X射线在ICT中的能谱硬化修正模型Hardening Correction Model of Energy Spectrum for Continuous Spectrum X-Ray ICT
- α-射线能谱计alpha-ray pectrometer
- γ射线能谱仪gamma-ray spectrometey
- X射线光电子能谱在材料研究中的应用Applications of X-ray Photoelectron Spectroscopy(XPS)in Materials Research
- 连续Ｘ射线能谱continuous X-ray spectrum
- 高分辨 射线能谱测定法high resolution gamma ray spectrometry
- 砷化镓半导体表面自然氧化层的X射线光电子能谱分析X-Ray Photoelectron Spectrocopic Analysis of Native Oxides Layer on Gallium Arsenide Semiconductor Surface
