This focused primary beam of gallium ions is rastered (scanned) on the surface of material to be analyzed.As it hits the surface ,a small amount of material is sputtered or dislodged from the surface.

• 这聚焦的镓离子原射束在被分析的材料表面作光栅式扫描，当接触表面时，少数材料会从表面飞溅或喷出。