There were Cr,O,C,Zn,P,N,F,Si in films ,which were detected by XPS technique, they existed in films as CrPO_4,Cr(OH)_3,CrOOH,Cr_2O_3,CrO_3,ZnO,Zn(OH)_2,Zn3(PO_4)_2,H_2O,NH_3,organic molecule and silica sol.

• 采用XPS技术检测了钝化膜中含有Cr,O,C,Zn,P,N,F,Si等并测定了各元素的相对含量,它们主要以CrPO_4,Cr(OH)_3,CrOOH,Cr_2O_3,CrO_3,ZnO,Zn(OH)_2,Zn_3(PO_4)_2,H_2O,NH_3,有机分子以及硅溶胶的形式存在于钝化膜中。