The surface appearance and microstructure of the films were characterized by Atomic Force microscope(AFM),X-ray diffraction (XRD)and Raman Scattering spectroscopy (Raman).

• 通过原子力显微镜(AFM)、X射线衍射仪(XRD)、拉曼散射(Raman)等技术对薄膜的表面形貌、微观结构等进行了表征。