The states of the surface Ti and the structure of Ti-MCM-41 were characterized by IR, DRS, XAFS, N2 adsorption, XRD and HRTEM.

• 进一步通过IR、DRS、XAFS、N2吸附法、XRD和HRTEM等表征方法研究了Ti在分子筛表面的存在状态和含钛MCM-41介孔分子筛的结构特性；