The species and sizes of domains in BST thin films were investigated by piezoresponse force microscopy (PFM).

• 采用压电力显微镜(PFM)研究了BST薄膜中电畴的类型和尺寸。 不仅证实BST薄膜中存在90°铁电畴,而且确定了BST薄膜由多畴转变为单畴结构的晶粒临界尺寸(单畴临界尺寸)为31nm左右。