The samples were characterized by X-ray diffraction (XRD), Scanning electronic microscope (SEM), photoluminescence (PL) and X-ray excited luminescence (XEL) spectra.

• 分别以X-射线衍射(XRD)、扫描电子显微镜(SEM)、光致发光(PL)光谱及X-射线激发的发光(XEL)光谱对样品进行了表征。