The results of X-ray diffraction (XRD) and electron probe microanalyser (EPMA) analysis showed that, after treating with nitrogen implantation, the TiN(200)peak of the coatings and the interface between the coatings and substrate become wider.

• X-射线衍射及电子探针分析发现,基体经离子注氮预处理后镀层的TiN(200)峰宽化,镀层与基体的界面变宽。