The product was analyzed and characterized by X-ray diffraction (XRD), X-ray fluorescence spectrum (XRF), inductive coupled plasma emission spectrum (ICP), scanning electron microscope (SEM) and transmission electron microscope (TEM).

• 通过X射线衍射(XRD)、荧光光谱分析(XRF)、电感耦合等离子体发射光谱(ICP)、扫描电子显微镜(SEM)及透射电子显微镜(TEM)等分析手段对产品氢氧化镁进行了分析和表征。