The physical and chemical properties including the crystal and morphological structure of the film, the size and band-gap-edge of TiO2 particles were characterized by XRD, SEM, AFM, DRS.

• 采用SEM、AFM、XRD、DRS等手段评价了TiO2薄膜的表面形貌、尺寸、晶型、吸收带边等物化性能；