The microstructures of shot peening strengthening layer on Titaniun were studied by optical microscopy (OM), scanning electron microscopy (SEM), and transmission electron microscopy (TEM).

• 利用光学显微分析(OM)、扫描电子显微分析(SEM)及透射电子显微分析(TEM)对喷丸强化工业纯钛表层组织特征进行了研究。