Testing Costs

• 测试代价

Testing Costs的用法和样例：

例句

1. The generation of a sort of uniform AMS IC DFT technique with low test cost and high fault coverage will meet the need of further development on IC design.
   统一的低测试代价和高故障覆盖率的模拟及混合信号芯片可测性设计方法的产生对于芯片设计来说将是进一步发展的要求和保障。