It is found that a homogenization in electron density takes place during annealing, which is attributed to the change from topological short range order (TSRO) structural relaxation to chemical short range order (CSRO) structural relaxation.

• 在一定的退火温度下、随退火时间的增加 ,拓扑短程序弛豫与化学短程序弛豫之间存在一个电子密度均匀化的过程 ;