Index of refractive was derived from the ellipsometer.Raman spectroscopy and XPS were used to analyze the structure and composition of the films.

• 用SEM分析了薄膜的断面形态，在椭偏仪上测得其折射率，并对薄膜进行了Raman光谱、XPS分析，在没有极化的条件下进行了二阶非线性Maker条纹检测。