In order to avoid adopting the generation II scan mode taking much time for the ICT testing of large components, a new scan mode based generation III scan mode called bias scan was discussed and its reconstruction algorithm based on FBP was deduced.

• 对于较大尺寸构件ICT检测,为了避免采用费时的二代扫描,讨论了一种基于三代扫描的偏置扫描方式,推导了它的FBP重构算法。