However, no methodology is available for use to determine the percentage of nanocrystal in the amorphous phase.This problem has now been solved by small-angle scattered X-ray analysis.

• 但研究此类复合镀层，至今未有现成的方法来测定非晶与纳米晶粒的比例，本文采用小角X射线散射解决了这一新问题。