Finally, from the small-signal model, the transconductance (gm0), drain-to-source resistance (Rds), and gate-to-source capacitance (Cgs) suffer more degradation after HC stress and oxide breakdown.

• 最后，透过小讯号模型的分析，我们发现金氧半场效电晶体的互导，汲极到源极的电阻以及闸极到源极的电容受到热载子效应以及氧化层崩溃的影响较大。