FIB/SEM System has been playing an important role in failure analysis, nanomaterials characterization and nanoscale prototyping and etc.

 
  • 摘要聚焦离子束电子束系统在材料失效分析、纳米材料结构表征与性能分析以及纳米器件研制等方面发挥着重要作用。
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