Because of the high integration characteristic of resonant tunneling diode (RTD) circuits, design for testability is significantly important to simplify the RTD circuits testing.

• 针对共振隧穿二极管(RTD)电路由于具有超高集成度特点所带来的电路测试困难,在故障分析与故障模型的基础上提出了RTD电路的可测试性设计方案。