BIST with a controlled LFSR can skip pseudo-random test vectors not contributing to the fault coverage, thus the length of test vectors and the time of test are reduced.

• 使用受控LFSR可以跳过伪随机测试序列中对故障覆盖率没有贡献的测试矢量，从而达到减少测试矢量长度，缩短测试时间的目的。