Automatic test pattern generation (ATPG);Design-for-testability;IDDQ testing;Break fault;Bridging fault;Built-in current sensor;Built-in intermediate voltage sensor是什么意思_Automatic test pattern generation (ATPG);Design-for-testability;IDDQ testing;Break fault;Bridging fault;Built-in current sensor;Built-in intermediate voltage sensor在线翻译_英语_读音_用法_例句